Summary
This paper develops statistical methods for handling 1/f (flicker) noise in metrological contexts, providing confidence interval relationships for arithmetic means and linear drift parameters. For lighting design, accurate flicker metrology is essential for characterizing and mitigating temporal light modulation that can cause discomfort, eye strain, and health effects.
Key Findings
- Establishes mathematical relationships for calculating confidence intervals over arithmetic mean and linear drift parameters in the presence of 1/f noise
- Provides a complete worked example of processing an actual measurement sequence affected by 1/f noise, offering a practical framework for flicker measurement standardization
Categories
The Science of Light: This paper addresses flicker metrology and measurement of 1/f noise, which is directly relevant to quantifying light flicker in lighting systems and establishing measurement standards.
Author(s)
P TEIKARI
Publication Year
2006
Number of Citations
1
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